Argonne National Laboratory Center for Nanoscale Materials U.S. Department of Energy

Proximal Probes


Omicron VT-AFM XA microscope scanning tunneling microscope

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Variable-temperature, ultra-high-vacuum, atomic force microscope/scanning tunneling microscope:
Omicron VT-AFM XA

(N. Guisinger, Electronic & Magnetic Materials & Devices Group)

  • Measurement modes include:
    • Contact and non-contact AFM
    • Magnetic force microscopy (MFM)
    • Scanning tunneling spectroscopy
  • Preparation tools include:
    • Resistive sample heating
    • Direct current heating
    • E-beam heating
    • Sputter ion etching
    • Gas dosing
    • E-beam evaporation
  • An analysis chamber contains combined four-grid LEED/Auger optics

Omicron nanoprobe

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Scanning probe/scanning electron microscopy: Omicron UHV Nanoprobe
(N. Guisinger, Electronic & Magnetic Materials & Devices Group)

  • Local, nondestructive four-point contact measurements and function testing of nanodevices within complex structures; accurate probe positioning and safe approach of fragile probe tips having diameters in the range of a few tens of nanometers or less.
  • Four independent STM probe tips with simultaneous SEM imaging enables a large field of view for coarse positioning as well as fine positioning of nanometer-sized structures with the SEM's high-resolution capabilities.
  • UHV Gemini column for chemical mapping by scanning auger microscopy and magnetic imaging by SEM with polarization analysis (SEMPA). This yields complementary information on sample conductance, topography, chemistry, and magnetism.

Scanning Probe Microscopy - Veeco AFM

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Scanning probe microscopy

  • Veeco Multimode with NanoScope V Controller
    (S. Darling, Electronic & Magnetic Materials & Devices Group)
    • Ambient measurements in contact or tapping mode
    • Fluid imaging
    • Low-current scanning tunneling microscopy
    • Magnetic force microscopy
    • Scanning tunneling microscopy
    • Variable temperature imaging
  • PSIA XE-HDD with 6-inch wafer stage
    (R. Divan, Nanofabrication Group)
    • contact and non-contact modes
    • scanning thermal microscopy
    • magnetic force microscopy

Near field scanning optical microscope

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Near-field scanning optical microscope
(NSOM, see D. Gosztola, Nanophotonics Group)

  • Apertureless and aperture
  • Laser excitation from 260 nm to 2.4 microns.
  • Variable illumination and detection geometries to accommodate a range of samples and near-field contrast mechanisms.
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