Argonne National Laboratory Center for Nanoscale Materials U.S. Department of Energy

Nanofabrication and Devices Facilities

In this facility, controlled synthesis and directed assembly of nanomaterials; lithographically assisted patterning of hybrid structures; chemical and biological functionalization of nanoscale materials; electron-beam lithography, focused ion beams, and nanoimprint patterning methods are performed.

Capabilities

Lithography

  • 100-kV electron-beam lithography (JEOL 9300 FS)
  • 30-kV electron-beam lithography (Raith 150)
  • Focused ion beam/scanning electronc microscopy (FEI Nova 600 NanoLab Dual Beam)
  • Step-and-repeat nanoimprint (Nanonex NX-3000)
  • Optical mask aligner (Karl Suss MA6)
Resist Processing
  • Spin coaters
  • Hot plates
  • Bake oven
  • HMDS priming oven
Plasma Processing
  • Inductive coupled plasma reactive ion etching chlorine chamber (Cl2, SF6, BCl3, HBr, CHF3, CO, O2, Ar) (Oxford Instruments Plasmalab 100)
  • Reactive ion etching fluorine chamber (SF6, CF4, CH4, CHF3, HCFC-124, H2, O2, Ar) (Oxford Instruments Plasmalab 100 )
  • Table-top reactive ion etching chlorine chamber (Cl2, CH4, H2, O2, Ar) (March Plasma)
  • Table-top reactive ion etching fluorine chamber (SF6, CF4, H2, O2, Ar) (March Plasma)
  • Table-top reactive ion etcher (CF, SF6, Ar, O2) (Plasma Sciences 600)
  • Barrel asher system (Ar, N2, O2) (PlasmaTherm)
Wet Processing
  • Wafer rinse dryer tool (2-, 4-, and 6-inch)
  • Electroforming (Au, Cu, Ni, Pt)
  • Silicon anisotropic etching, membrane fabrication
  • Wet etching
  • Potentiostat
Metrology
  • Optical microscope (Olympus MX-61)
  • Three-dimensional surface profilometer (Veeco Dektak 8)
  • Profilometer (Tencor Alpha Step 500)
  • Reflectometer (Filmetrics)
  • Scanning vibrating electrode (Princeton)
  • Far-ultraviolet – near-infrared spectroscopic ellipsometer (Horiba Jobin Yvon UVISEL)
  • Scanning probe microscope (PSIA XE-HDD with 6-inch wafer stage)
    • Contact and non-contact modes
    • Scanning thermal microscopy
    • Magnetic force microscopy
Deposition
  • PECVD nanocrystalline diamond deposition (Lambda)

More Nanofabrication Information

A. Imre (CNM) examines the specimen stage of the FEI Nova NanoLab FIB/SEM instrument; small specimens or full wafers up to 6 inches to be processed by the ion beam.

 

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