Argonne National Laboratory Center for Nanoscale Materials U.S. Department of Energy

Electronic & Magnetic Materials & Devices Capabilities

Synthesis

  • Colloidal chemistry and self-assembly techniques
  • Complex oxide film synthesis via molecular beam epitaxy (DCA R450 Custom)
  • Physical vapor deposition (Lesker CMS 18 and PVD 250)
  • Spin coating (Laurell WS-400)

Characterization

  • Variable-temperature (VT) scanning tunneling microscope with atomic force microscopy capabilities (Omicron VT-AFM/STM), operates in an ultrahigh vacuum (UHV) environment with a base pressure of < 1E-10 mbar and 55-400 K. Atomic resolution is routinely obtained at room temperature and below. The AFM capabilities support a range of scanning modes. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (sputter cleaning, direct current heating, e-beam heating stage, metal deposition, etc.)
  • Variable-temperature scanning tunneling microscope (home-built VT-STM) operates in an UHV environment with a base pressure of < 1E-10 mbar and 55-300 K. Atomic resolution is routinely obtained at room temperature and below. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (sputter cleaning, direct current heating, e-beam heating stage, metal deposition).
  • Scanning probe microscope Veeco MultiMode 8 [contact or tapping mode, fluid imaging, low-current scanning tunneling microscopy, magnetic force microscopy, variable temperature imaging (-30-250°C), conductive atomic force microscopy, PeakForce tapping mode and PeakForce quantitative nanomechanical mapping]
  • Characterization of electrical transport properties at the nanoscale via state-of-the-art UHV nanoprobes (4-tip SEM Omicron UHV Nanoprobe)
  • Internal/external quantum efficiency measurement system (Oriel IQE-200)
  • Luminescence spectrometer (Perkin-Elmer LS 55)
  • Magnetic and physical properties characterization suite ( Keithley 4200-SCS/F Semiconductor Parameter Analyzer, Quantum Design PPMS-9 and MPMS XL)
  • Optical microscope (Zeiss Axio Imager Z1 M Upright)
  • Rheometer (AntonPaar Physica MCR301)
  • Solar simulator (Oriel)
  • Thermal analysis [differential scanning calorimetry (Mettler Toledo 823) and thermogravimetric analysis (Mettler Toledo 851)]
  • Ultraviolet-visible-near-infrared spectrometer (Perkin-Elmer Lamda 950)
  • Variable-temperature magneto-optical microscopy with high-resolution spectroscopy capability.
  • X-ray diffractometer (Bruker D8 Discover, point detector, VÅNTEC-1 linear detector; Bragg-Brentano powder, Grazing incidence, high-resolution four-circle, reciprocal space mapping, reflectivity, rocking curves)

Modeling

  • Molecular modeling for geometry and electronic structure

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